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CS-ISTS-01 Image Sensor Test System
The CS-ISTS-01 Image Sensor Test System is designed for the electro-optical performance testing and characterization of CMOS, CCD, and other image sensors and imaging modules. The system integrates standardized optical test modules, a precision optical path, and automated data acquisition and analysis software for testing key image sensor performance parameters, analyzing measurement data, and archiving test results.
The system supports testing of dynamic range, dark noise, maximum signal-to-noise ratio (SNR), quantum efficiency (QE), electro-optical linearity, absolute sensitivity threshold, saturation capacity, dark signal non-uniformity (DSNU), and photo-response non-uniformity (PRNU). Image sensor performance can be characterized in accordance with relevant test methods of EMVA 1288.
The system is suitable for image sensor R&D, sensor chip and imaging module testing, product verification, quality inspection, and research applications, providing standardized optical test conditions and data analysis support for CMOS and CCD image sensors.
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Designed for the development of CMOS, CCD, and other image sensors, the system supports testing of key electro-optical performance parameters to provide measurement data for sensor performance analysis, parameter optimization, and product verification.
Suitable for image sensor chip development and testing, the system captures and analyzes sensor responses under different test conditions to support the evaluation of device electro-optical performance.
Designed for camera modules and machine vision imaging components, the system provides standardized optical test conditions and performance testing for module development, product verification, and quality inspection.
Suitable for performance testing and parameter analysis of industrial cameras, machine vision sensors, and related imaging products, providing measurement data for image performance evaluation.
Suitable for universities, research institutions, and third-party laboratories conducting image sensor performance research, test method verification, and measurement data analysis.
Integrates standardized optical test modules to provide stable and controllable optical test conditions for image sensors, with support for configurable multi-wavelength testing.
Equipped with standard test light sources covering visible and near-infrared wavelengths. Test wavelengths can be selected according to the spectral response characteristics of different image sensors:
460 nm, 525 nm, 625 nm, 905 nm, 1050 nm, 1200 nm, 1300 nm, 1550 nm
Supports testing of multiple key electro-optical performance parameters of image sensors, including:
Dynamic range, dark noise, maximum SNR, quantum efficiency (QE), electro-optical linearity, absolute sensitivity threshold, saturation capacity, dark signal non-uniformity (DSNU), and photo-response non-uniformity (PRNU).
The accompanying test software supports test condition configuration, data acquisition, parameter calculation, and result analysis, reducing repetitive manual operations and improving consistency throughout the testing workflow.
Test data and analysis results can be centrally archived, with standardized test reports generated according to testing requirements to support R&D analysis, product verification, and quality traceability.
Product Specifications
| Category |
Parameter |
Specification | |
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Spectral Light Source
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Standard Test Wavelengths
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460nm、525nm,、625nm、905nm、1050nm、1200nm、1300nm,、1550nm
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Spectral Bandwidth (FWHM)
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≤50nm
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Optical Output
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Illuminated Area |
95mm | |
| Optical Power Stability |
＜1%
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| Test Object |
Sensor Type |
CMOS, CCD, and other image sensors |
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| Test Capability | Test Items |
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| Test Method | Automated Testing |
Automated data acquisition, analysis, and result output |
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| Data Management | Data and Reports |
Test data archiving, result analysis, and standardized test reports |
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| Equipment | Dimensions | 910mm × 130mm (L × W) |
The system can be used for image sensor and machine vision camera performance characterization in accordance with relevant EMVA 1288 test methods, supporting the testing and analysis of parameters including dynamic range, dark noise, SNR, absolute sensitivity threshold, saturation capacity, DSNU, and PRNU.
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Contact: sales@colorspace.com.cn
Phone: 15817270587
Tel: 400-886-3881(周一至周五 9:00~18:00)
Email: sales@colorspace.com.cn
Add: South Building #2-1101, Lv Di Qi Hang Office Building, Hou Sha Yu, Shun Yi District, Beijing, China
