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Distortion&Pre-Distortion Test Charts

  • Dot Pattern Test Chart
Dot Pattern Test Chart

Dot Pattern Test Chart

  • Brand: ColorSpace/IQL
  • Model: CS-TC005
  • Product description: The CS-TC005 Dot Pattern Test Chart is designed for analyzing lateral chromatic aberration, SMIA TV distortion, and field of view in lenses and imaging systems.
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Dot Pattern Test Chart

The CS-TC005 Dot Pattern Test Chart features a regular dot pattern for analyzing geometric distortion, lateral chromatic aberration, and field of view (FOV) in lenses and imaging systems.

The chart is available in 1X, 2X, and 4X configurations, with different chart and dot sizes to accommodate different lens fields of view, working distances, and imaging test setups. It can be used for image quality testing of industrial vision systems, security cameras, automotive imaging systems, consumer imaging devices, and other optical imaging applications.

点状图测试卡


Features

01 | Regular Dot Pattern

The chart consists of regularly arranged circular dots distributed across the test area. The dot positions provide spatial reference points for analyzing lens distortion and lateral chromatic aberration across the image field.

02 | Lateral Chromatic Aberration Analysis

By comparing the image positions of corresponding dots across different color channels, the chart can be used to evaluate lateral chromatic aberration at different image field positions.

03 | SMIA TV Distortion Analysis

The dot pattern can be used for geometric distortion analysis, including SMIA TV Distortion and related lens distortion measurements.

SMIA TV Distortion is a commonly used metric for evaluating geometric distortion in imaging systems and lens testing.

04 | Field of View (FOV) Testing

Combined with the physical chart dimensions, lens-to-chart distance, and image analysis results, the chart can be used to calculate or evaluate the field of view (FOV) of an imaging system.

05 | Multiple Sizes for Different Test Setups

The CS-TC005 is available in 1X, 2X, and 4X configurations. Different chart dimensions and dot sizes allow the chart to be selected according to the lens field of view and test distance.


Test and Analysis

For testing, the CS-TC005 is positioned within the field of view of the lens or imaging system and captured under the required test conditions. Image analysis software is then used to detect the positions of the dots.

By analyzing the image coordinates of dots across the test field, the chart can provide data for evaluating:

  • Lateral Chromatic Aberration
  • SMIA TV Distortion
  • Field of View (FOV)
  • Geometric distortion-related parameters

The specific test procedure, analysis region, and calculation method should be determined according to the applicable test standard, image analysis software, and test setup.


Specifications

Parameter Dot Pattern Test Chart 
Model CS-TC005
Configuration 1X 2X 4X
Chart Size 280mm × 210mm
900mm × 600mm
1600mm × 1000mm
Dot Size 2.364mm × 2.364mm
7.6mm × 7.6mm
13.511mm × 13.511mm
Dot Pitch 7.373mm
23.7mm
42.111mm
Dot Pattern 37 rows × 25 columns
Chart Type Reflective


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